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Titlebook: Observational Evidence for Black Holes in the Universe; Proceedings of a Con Sandip K. Chakrabarti Conference proceedings 1999 Springer Sci

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this concept usually refers to a sequence of operations carried out in a single work chamber, or a series of such work chambers [1]. Figure 1 conceptually illustrates such a system which in this case is designed for Ultra High Vacuum (UHV) processing. The transfer from chamber to chamber is highly
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Ju-Fu Lu (i.e. resist-level patterns) are common to virtually all fabrication processes. Wafer defects are considered in Section 3.1 while lithography defects are discussed in Section 3.2. There are also major defect mechanisms arising during deposition and etching of the thin film dielectric and metalizati
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Dongsu Ryueffects. Defects during patterning or film depositions can lead to shorts, open lines or defective transistors, as discussed in the previous chapter. Such defect-based faults are considered in this chapter. However, faults also arise through degradation in features, such as electromigration failure
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D. Molteni,G. Gerardi,M. A. Valenza,G. Lanzafameeffects. Defects during patterning or film depositions can lead to shorts, open lines or defective transistors, as discussed in the previous chapter. Such defect-based faults are considered in this chapter. However, faults also arise through degradation in features, such as electromigration failure
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B. Mukhopadhyayl-purpose testing schemes. Three distinct circuit functions (memory arrays, regular logic arrays and programmable logic arrays) are used as examples of the various techniques which can be used. A major issue for special purpose testing is reduction of the size of the set of test vectors, drawing on
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Tapas K. Dasditions of office work and the relations between clerical workers and management. A growing disjunction between office clerical workers and management in the insurance industry has accompanied office automation during the post-World War II era. As management automates the office to raise worker prod
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