Titlebook: Noncontact Atomic Force Microscopy; S. Morita,R. Wiesendanger,E. Meyer Book 2002 Springer-Verlag Berlin Heidelberg 2002 AFM.Bias.Helium-At

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https://doi.org/10.1007/978-3-642-56019-4AFM; Bias; Helium-Atom-Streuung; Noncontact atomic; True atomic resolution; deformation; experiment; measur

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S. Morita,R. Wiesendanger,E. MeyerThis book is a top state-of-the-art report on all the methods in noncontact atomic force microscopy prepared by the leading experts in the field.Includes supplementary material:

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Principle of NC-AFM, While the STM is an ingenious instrument which has shattered many paradigms about how to access the world of single atoms, the actual device is quite simple and grants an instructive appreciation of the concepts of atomic-scale imaging. The AFM is somewhat more complicated and the additional challe

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Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductor Surfaces,in this book. However, the exact nature of what the NC-AFM image represents is still the subject of some dispute because of the complexity of the interaction between the condensed matter making up the sample and the tip. For example, the Si adatom contrast of Si(111)7x7 as depicted by the NC-AFM doe

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