Titlebook: New Horizons of Applied Scanning Electron Microscopy; Kenichi Shimizu,Tomoaki Mitani Book 2010 Springer-Verlag Berlin Heidelberg 2010 High

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Application Example 8: Cross-Sectional Examination of a Galvanized Steel,

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Application Example 10: Cross-Sectional Examination of Solder Joint of the Printed Circuit Board,

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Application Example 11: Cross-Sectional Examination of a Tin-Plated Copper Sheet for Electronic App

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Application Example 12: Cross-Sectional Examination of an Anodized Aluminum Alloy for Aerospace App

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Application Example 13: Cross-Sectional Examination of a Porous Anodic Oxide Film Grown on a Hetero

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Application Example 15: Cross-Sectional Examination of an Etched Al Foil for Capacitor Application,

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Application Example 16: On the Nature of rf-GD Sputtering,

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Application Example 17: On the Surface Damages Associated with rf-GD Sputtering,

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