找回密码
 To register

QQ登录

只需一步,快速开始

扫一扫,访问微社区

Titlebook: Neural Models and Algorithms for Digital Testing; Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L Book 1991 Springer Science+Business M

[复制链接]
查看: 12159|回复: 55
发表于 2025-3-21 19:56:30 | 显示全部楼层 |阅读模式
书目名称Neural Models and Algorithms for Digital Testing
编辑Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L
视频video
丛书名称The Springer International Series in Engineering and Computer Science
图书封面Titlebook: Neural Models and Algorithms for Digital Testing;  Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L Book 1991 Springer Science+Business M
描述References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy Minimization. . . . . . . . . . . . . 94 9. 5. 1 Transitive Oosure . . . . . . . . . . . . . . . . . 94 9. 5. 2 Additional Pairwise Relationships 96 9. 5. 3 Path Sensitization . . . . . . . . . . . . . . . . . 97 9. 6 Experimental Results 98 9. 7 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 100 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 10 TRANSITIVE CLOSURE AND TESTING 103 10. 1 Background . . . . . . . . . . . . . . . . . . . . . . . . 104 10. 2 Transitive Oosure Definition 105 10. 3 Implication Graphs 106 10. 4 A Test Generation Algorithm 107 10. 5 Identifying Necessary Assignments 112 10. 5. 1 Implicit Implication and Justification 113 10. 5. 2 Transitive Oosure Does More Than Implication and Justification 115 10. 5. 3 Implicit Sensitization of Dominators 116 10. 5. 4 Redundancy Identifica
出版日期Book 1991
关键词algorithms; circuit; complexity; computer; integrated circuit; logic; model; modeling; network; networks; neur
版次1
doihttps://doi.org/10.1007/978-1-4615-3958-2
isbn_softcover978-1-4613-6767-3
isbn_ebook978-1-4615-3958-2Series ISSN 0893-3405
issn_series 0893-3405
copyrightSpringer Science+Business Media New York 1991
The information of publication is updating

书目名称Neural Models and Algorithms for Digital Testing影响因子(影响力)




书目名称Neural Models and Algorithms for Digital Testing影响因子(影响力)学科排名




书目名称Neural Models and Algorithms for Digital Testing网络公开度




书目名称Neural Models and Algorithms for Digital Testing网络公开度学科排名




书目名称Neural Models and Algorithms for Digital Testing被引频次




书目名称Neural Models and Algorithms for Digital Testing被引频次学科排名




书目名称Neural Models and Algorithms for Digital Testing年度引用




书目名称Neural Models and Algorithms for Digital Testing年度引用学科排名




书目名称Neural Models and Algorithms for Digital Testing读者反馈




书目名称Neural Models and Algorithms for Digital Testing读者反馈学科排名




单选投票, 共有 1 人参与投票
 

0票 0.00%

Perfect with Aesthetics

 

0票 0.00%

Better Implies Difficulty

 

1票 100.00%

Good and Satisfactory

 

0票 0.00%

Adverse Performance

 

0票 0.00%

Disdainful Garbage

您所在的用户组没有投票权限
发表于 2025-3-21 23:53:33 | 显示全部楼层
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil
发表于 2025-3-22 00:30:47 | 显示全部楼层
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil
发表于 2025-3-22 04:49:34 | 显示全部楼层
发表于 2025-3-22 10:05:01 | 显示全部楼层
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil
发表于 2025-3-22 12:56:45 | 显示全部楼层
发表于 2025-3-22 19:12:40 | 显示全部楼层
发表于 2025-3-22 22:33:37 | 显示全部楼层
发表于 2025-3-23 01:41:18 | 显示全部楼层
发表于 2025-3-23 08:33:27 | 显示全部楼层
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil
 关于派博传思  派博传思旗下网站  友情链接
派博传思介绍 公司地理位置 论文服务流程 影响因子官网 SITEMAP 大讲堂 北京大学 Oxford Uni. Harvard Uni.
发展历史沿革 期刊点评 投稿经验总结 SCIENCEGARD IMPACTFACTOR 派博系数 清华大学 Yale Uni. Stanford Uni.
|Archiver|手机版|小黑屋| 派博传思国际 ( 京公网安备110108008328) GMT+8, 2025-5-17 09:30
Copyright © 2001-2015 派博传思   京公网安备110108008328 版权所有 All rights reserved
快速回复 返回顶部 返回列表