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Titlebook: Nanotribology and Nanomechanics; An Introduction Bharat Bhushan Book 2008Latest edition Springer-Verlag Berlin Heidelberg 2008 Adhesion, Fr

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Introduction – Measurement Techniques and Applicationseld of micro/nanotribology are described. Next, various measurement techniques used in micro/nanotribological and micro/nanomechanical studies are described. The interest in micro/nanotribology field grew from magnetic storage devices and latter the applicability to emerging field micro/nanoelectrom
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Probes in Scanning Microscopies of high resolution and broad applicability has lead to the application of SPM to many areas of science and technology, especially those interested in the structure and properties of materials at the nanometer scale. SPM images are generated through measurements of a tip-sample interaction. A well-c
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Noncontact Atomic Force Microscopy and Related Topicsnologies for nanotechnology and also for future bottom-up processes. In Sect. 24.1, the principles of AFM such as its operating modes and the NC-AFM frequency-modulation method are fully explained. Then, in Sect. 24.2, applications of NC-AFM to semiconductors, which make clear its potential in terms
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Dynamic Modes of Atomic Force Microscopyct-mode) AFM is a widespread technique to obtain nanometer-resolution images on a wide variety of surfaces, true atomic-resolution imaging is routinely observed only in the dynamic mode. We will explain the jump-to-contact phenomenon encountered in static AFM and present the dynamic operational mode
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Surface Forces and Nanorheology of Molecularly Thin Films that can be observed between: (i) bare surfaces in contact (dry or interfacial friction), (ii) surfaces separated by a thin liquid film (lubricated friction), and (iii) surfaces coated with organic monolayers (boundary friction). Experimental methods suitable for measuring normal surface forces, ad
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