Titlebook: Nanotribology and Nanomechanics; An Introduction Bharat Bhushan Textbook 20051st edition Springer-Verlag Berlin Heidelberg 2005 Adhesion, F

Anthropoid

Markus Morgenstern,Alexander Schwarz,Udo D. Schwarz

Extemporize

Marina Ruths,Alan D. Berman,Jacob N. Israelachvili

Definitive

Enrico Gnecco,Roland Bennewitz,Oliver Pfeiffer,Anisoara Socoliuc,Ernst Meyer

Cloudburst

Andrzej J. Kulik,András Kis,Gérard Gremaud,Stefan Hengsberger,Philippe K. Zysset,Lásló Forró

情感脆弱

多余

Probes in Scanning Microscopies correspond to the tip radius of curvature, the tip aspect ratio, and the sample height. Although silicon and silicon nitride tips have a somewhat large radius of curvature, low aspect ratio, and limited lifetime due to wear, the widespread use of AFM today is due in large part to the broad availabi

反省

Low Temperature Scanning Probe Microscopyexcitations (scanning near-field microscopy) can be measured with high spatial resolution. In addition, some techniques even allow the manipulation of atomic configurations..Probably the most important advantage of the low-temperature operation of scanning probe techniques is that they lead to a sig

身体萌芽

FEAS

敬礼

Micro/Nanotribology and Materials Characterization Studies Using Scanning Probe Microscopytches. For a sliding interface requiring near-zero friction and wear, contact stresses should be below the hardness of the softer material to minimize plastic deformation, and surfaces should be free of nanoscratches. Wear precursors can be detected at early stages of wear by using surface potential