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Titlebook: Nanoelectronic Coupled Problems Solutions; E. Jan W. ter Maten,Hans-Georg Brachtendorf,Herber Book 2019 Springer Nature Switzerland AG 201

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发表于 2025-3-21 19:15:48 | 显示全部楼层 |阅读模式
书目名称Nanoelectronic Coupled Problems Solutions
编辑E. Jan W. ter Maten,Hans-Georg Brachtendorf,Herber
视频video
概述Combines advanced methods for solving strongly coupled problems involving multirate dynamics in time and frequency domain with applications to Uncertainty Quantification and Fast Fault Simulation.Uniq
丛书名称Mathematics in Industry
图书封面Titlebook: Nanoelectronic Coupled Problems Solutions;  E. Jan W. ter Maten,Hans-Georg Brachtendorf,Herber Book 2019 Springer Nature Switzerland AG 201
描述.Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:.. (1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; ..(2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimizatio
出版日期Book 2019
关键词multirate; model order reduction; co-simulation; uncertainty quantification; power-MOS devices; RF-circui
版次1
doihttps://doi.org/10.1007/978-3-030-30726-4
isbn_softcover978-3-030-30728-8
isbn_ebook978-3-030-30726-4Series ISSN 1612-3956 Series E-ISSN 2198-3283
issn_series 1612-3956
copyrightSpringer Nature Switzerland AG 2019
The information of publication is updating

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发表于 2025-3-21 22:38:09 | 显示全部楼层
Nanoelectronic Coupled Problems Solutions978-3-030-30726-4Series ISSN 1612-3956 Series E-ISSN 2198-3283
发表于 2025-3-22 03:16:40 | 显示全部楼层
E. Jan W. ter Maten,Hans-Georg Brachtendorf,HerberCombines advanced methods for solving strongly coupled problems involving multirate dynamics in time and frequency domain with applications to Uncertainty Quantification and Fast Fault Simulation.Uniq
发表于 2025-3-22 08:05:19 | 显示全部楼层
EM-Equations, Coupling to Heat and to Circuitse considered, in particular: (1) the coupling of electromagnetic fields with circuits and (2) the electro-thermal coupling in power transistors. These cases are not exhaustive but are used as typical for identifying generic guidelines for addressing coupled problems.
发表于 2025-3-22 10:23:41 | 显示全部楼层
Bond Wire Modelse bond wire properties, e.g., its time to failure. Secondly, a more accurate model using the finite integration technique for spatial discretisation is constructed. This model is also used to study the impact of manufacturing uncertainties, e.g., variable bond wire lengths, on the performance of bond wires.
发表于 2025-3-22 16:46:46 | 显示全部楼层
Discretizationspproach. Furthermore the set up of coupled problems is addressed. Finally, it is shown that discretization requires a careful handling of the various terms in the discretization procedure, otherwise numerical unstable equations will appear.
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发表于 2025-3-22 23:13:47 | 显示全部楼层
https://doi.org/10.1007/978-3-030-30726-4multirate; model order reduction; co-simulation; uncertainty quantification; power-MOS devices; RF-circui
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发表于 2025-3-23 05:50:28 | 显示全部楼层
Book 2019bility in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-le
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