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Titlebook: Microelectronic Devices, Circuits and Systems; Third International V. Arunachalam,K. Sivasankaran Conference proceedings 2022 The Editor(s

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Sanskriti Singh,Sneha Kaushik,Anita Angeline Augustine,Sasipriya Palanisamyform and then has to hand it over to the ticket booking staff at the counter. The staff then has to re-enter those details into the computer system manually. It takes more time for the staff to type the information when the form has multiple passengers for the same journey. Though the counters work
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Shreya Atul Sharma,Abantee Gangopadhyay,K. T. Koushik,K. C. Sriharipriya,J. Christopher Clementesign educationThis book showcases cutting-edge research papers from the 7th International Conference on Research into Design (ICoRD 2019) – the largest in India in this area – written by eminent researchers from across the world on design processes, technologies, methods and tools, and their impact
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Shweta S. Patil,B. Srinivasa Varma,G. Devadasu,C. H. Hussaian Basha,M. J. R. Inamdar,S. S. Salmanl design decisions. A number of design-time reliability-analysis methods has been developed to support this task. However, the methods are often based on very low-level formalisms, and the connection to different architectural aspects (e.g., the system usage profile) is either hidden in the construc
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A. V. Shreyas Madhav,A. K. Ilavarasi,Amit Kumar Tyagiin practice is still challenging. Most enterprise applications include a large software basis, such as middleware and legacy systems. In many cases, the software basis is the determining factor of the system’s overall timing behavior, throughput, and resource utilization. To capture these influences
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K. T. Kavyadevi,Apurva Saindane,T. Vigneswaranin practice is still challenging. Most enterprise applications include a large software basis, such as middleware and legacy systems. In many cases, the software basis is the determining factor of the system’s overall timing behavior, throughput, and resource utilization. To capture these influences
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Viswateja Anjuru,W. Razia Sultanad slurry is investigated. The galvanic corrosion of Cu in a Cu-Ru coupled system has been studied from a completely different perspective. X-ray photoelectron spectroscopy combined with other measurements was used to reveal the synergistic passivation mechanism of BTA and K.MoO.. The results show th
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978-3-031-23972-4The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl
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Microelectronic Devices, Circuits and Systems978-3-031-23973-1Series ISSN 1865-0929 Series E-ISSN 1865-0937
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