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Titlebook: Microclusters; Proceedings of the F Satoru Sugano,Yuichiro Nishina,Shuhei Ohnishi Conference proceedings 1987 Springer-Verlag Berlin Heidel

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A. P. Kaldor,D. M. Cox,M. R. Zakinevelopments are considered in each section. Throughout, important concepts are highlighted using examples from RCT studies many of which were conducted as part of the National Drug Abuse Treatment Clinical Trials Network (CTN), which has conducted a large number of multisite RCTs over the past 15 ye
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Y. Achiba,K. Sato,K. Kimurabservations), and latent variable modeling techniques, including structural equation modeling, latent class analysis, latent transition analysis, and growth mixture modeling. Finally, overviews of four major special topics particularly important when using secondary data are provided, which include:
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Y. Saitoevelopments are considered in each section. Throughout, important concepts are highlighted using examples from RCT studies many of which were conducted as part of the National Drug Abuse Treatment Clinical Trials Network (CTN), which has conducted a large number of multisite RCTs over the past 15 ye
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0933-033X is partly due to rapid development of the experimental techniques which have enabled the production of relatively dense, non­ interacting microclusters of vario978-3-642-83066-2978-3-642-83064-8Series ISSN 0933-033X Series E-ISSN 2196-2812
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Level Set Methods for Variational Problems and Applications,nt of the costfunctional with respect to the interface. We discuss pre-conditioning techniques and Gauss-Newton method for selecting the normal velocity. A numerical result for the obstacle problem is presented.
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The Influence of Structure and Impurity Precipitation on the Electrical Properties of the Grain Boundaries in Silicon: Copper Precipitation in the Σ = 25 Boundaryhe specimens. The recombination properties and their dependence on passivation treatments in hydrogen have been investigated, using photocapacity, EBIC and LBIC measurements. The discussion of these electrical and microanalytical data suggests an implication in the electrical properties of the boundary, of precipitated metallic impurities.
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