| 书目名称 | Low-Power High-Resolution Analog to Digital Converters | | 副标题 | Design, Test and Cal | | 编辑 | Amir Zjajo,José Pineda de Gyvez | | 视频video | | | 概述 | Unique combination of design, test, debugging and calibration of A/D converters (probably only on the market).Numerous examples and easy to follow procedure for design, test, debugging and calibration | | 丛书名称 | Analog Circuits and Signal Processing | | 图书封面 |  | | 描述 | .With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability | | 出版日期 | Textbook 2011 | | 关键词 | BIST; Calibration; Debugging; Multi-Step ADC; Statistical Analysis | | 版次 | 1 | | doi | https://doi.org/10.1007/978-90-481-9725-5 | | isbn_softcover | 978-94-024-0530-9 | | isbn_ebook | 978-90-481-9725-5Series ISSN 1872-082X Series E-ISSN 2197-1854 | | issn_series | 1872-082X | | copyright | Springer Science+Business Media B.V. 2011 |
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发表于 2025-3-21 18:49:32
