| 书目名称 | Lock-in Thermography |
| 副标题 | Basics and Use for E |
| 编辑 | Otwin Breitenstein,Wilhelm Warta,Martin Langenkamp |
| 视频video | |
| 概述 | Only book in the market on this highly sensitive infrared measurement method.Explains the basics and applications of this analytical technique.A reference work for researchers and engineers alike.Incl |
| 丛书名称 | Springer Series in Advanced Microelectronics |
| 图书封面 |  |
| 描述 | In the last 7 years, the ?rst edition of “Lock-in Thermography” has established as a reference book for all users of this technique for investigating electronic devices, especially solar cells. At this time, a vital further development of lock-in therm- raphy could be observed. Not only the experimental technique was improved by applying new and better infrared cameras, solid immersion lenses, and novel t- ing strategies, but also completely new application ?elds of lock-in thermography were established by implying irradiation of light during the measurements. The two groups of new techniques are different kinds of Illuminated Lock-In Thermography (ILIT) and Carrier Density Imaging, resp. Infrared Lifetime Imaging (CDI/ILM). While ILIT is performed on solar cells, CDI/ILM is performed on bare wafers for imaging the local minority carrier lifetime and the local concentration of trapping centers. The new edition of this book implements these new developments. One new section entitled “Timing strategies” is added. In this, new ways are introduced to overcome previous limitations of the choice of the lock-in frequency in comparison with the frame rate of the camera. The previous diffra |
| 出版日期 | Book 20102nd edition |
| 关键词 | Failure analysis; Lifetime mapping; Shunt imaging; Solar cell characterization; Trap density mapping; dia |
| 版次 | 2 |
| doi | https://doi.org/10.1007/978-3-642-02417-7 |
| isbn_ebook | 978-3-642-02417-7Series ISSN 1437-0387 Series E-ISSN 2197-6643 |
| issn_series | 1437-0387 |
| copyright | Springer-Verlag Berlin Heidelberg 2010 |
发表于 2025-3-21 16:51:29
