Titlebook: Lock-in Thermography; Basics and Use for E Otwin Breitenstein,Wilhelm Warta,Martin C. Schuber Book 2018Latest edition Springer Nature Switz

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书目名称Lock-in Thermography影响因子(影响力)学科排名




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书目名称Lock-in Thermography网络公开度学科排名




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书目名称Lock-in Thermography被引频次学科排名




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书目名称Lock-in Thermography读者反馈学科排名

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1437-0387 ermography.Is useful as a reference work for researchers and.This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Peri

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Introduction,ngly less restricted, now also entering the civil market. Apart from night vision applications, the dominant applications of thermography are the imaging of temperature differences in daily life (e.g., heat losses in buildings), in technique (e.g., monitoring of power stations), and in biology/medicine (e.g., skin temperature mapping).

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https://doi.org/10.1007/978-3-319-99825-1Solar Cell Characterization; Shunt Imaging; IC Failure Analysis; Electronic Device Failure Analysis; Tra

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Otwin Breitenstein,Wilhelm Warta,Martin C. SchuberDescribes an imaging technique for the evaluation of materials and electronic devices.Discusses various new application fields of lock-in thermography.Is useful as a reference work for researchers and

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Typical Applications,esented in the examples given in Chap. .. In the following section we will present some more applications, showing the universal applicability of this technique to different fields of functional diagnostics of electronic components.