| 书目名称 | Lock-in Thermography |
| 副标题 | Basics and Use for E |
| 编辑 | Otwin Breitenstein,Wilhelm Warta,Martin C. Schuber |
| 视频video | |
| 概述 | Describes an imaging technique for the evaluation of materials and electronic devices.Discusses various new application fields of lock-in thermography.Is useful as a reference work for researchers and |
| 丛书名称 | Springer Series in Advanced Microelectronics |
| 图书封面 |  |
| 描述 | .This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.. |
| 出版日期 | Book 2018Latest edition |
| 关键词 | Solar Cell Characterization; Shunt Imaging; IC Failure Analysis; Electronic Device Failure Analysis; Tra |
| 版次 | 3 |
| doi | https://doi.org/10.1007/978-3-319-99825-1 |
| isbn_ebook | 978-3-319-99825-1Series ISSN 1437-0387 Series E-ISSN 2197-6643 |
| issn_series | 1437-0387 |
| copyright | Springer Nature Switzerland AG 2018 |
发表于 2025-3-21 16:20:49
