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Titlebook: Legacy Data: A Structured Methodology for Device Migration in DSM Technology; Pallab Chatterjee Book 2003 Springer Science+Business Media

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发表于 2025-3-21 16:15:31 | 显示全部楼层 |阅读模式
书目名称Legacy Data: A Structured Methodology for Device Migration in DSM Technology
编辑Pallab Chatterjee
视频videohttp://file.papertrans.cn/584/583678/583678.mp4
图书封面Titlebook: Legacy Data: A Structured Methodology for Device Migration in DSM Technology; Pallab Chatterjee Book 2003 Springer Science+Business Media
描述.Legacy Data: A Structured Methodology For Device Migration in DSM Technology. deals with the migration of existing hard IP from one technology to another using repeatable procedures. The challenge of hard IP migration is not simply an EDA problem but rather a client application specification problem. It requires a deep understanding of the process technologies, EDA tools (and their interfaces) and target applications. .Legacy Data: A Structured Methodology For Device Migration in DSM Technology. is unique in that there are currently no reference books focused on legacy data reuse, especially for hard IP. This book will allow CAD practitioners to quickly develop methodologies that capitalize on the large volumes of legacy data available within a company today. It details the issues of developing a structured methodology, building verification test benches, and validating the final physical design.
出版日期Book 2003
关键词Chatterjee; Olson; Signal; Technologie; Wafer; computer-aided design (CAD); design; interconnect; layout; pub
版次1
doihttps://doi.org/10.1007/978-1-4615-0241-8
isbn_softcover978-1-4613-4982-2
isbn_ebook978-1-4615-0241-8
copyrightSpringer Science+Business Media New York 2003
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发表于 2025-3-21 21:46:34 | 显示全部楼层
New Rules for DSM Flows,dress like processes and are intended to cover the additional details of device change migration. Some of these device change migrations include traditional CMOS designs being ported to a SiGe process technology. Some of these process selection issues are:
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发表于 2025-3-22 03:01:02 | 显示全部楼层
Process Compatibility,OS processes. Process issues that have long been ignored are now critical to both the correct design but also correct selection of the process. Masking correction methods like OPC have resurfaced as correction solutions for the first time since the metal gate era.
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发表于 2025-3-22 04:35:07 | 显示全部楼层
Test Bench Requirements,of the legacy block. As such, it is the piece of the puzzle that let the engineering know when he has successfully completed the re-engineering task or has to keep working on it. Without the availability of a test bench, the design block cannot be re-engineered for reuse.
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发表于 2025-3-22 09:23:56 | 显示全部楼层
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发表于 2025-3-22 14:16:31 | 显示全部楼层
Design Validation,ave selected a block for migration, identified a compatible target process, identified the test bench for the design, determined the relevant design views were available to perform the migration and then performed the engineering re-design task on the block in a hierarchical fashion. This next task
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发表于 2025-3-22 17:17:52 | 显示全部楼层
Physical Design Migration,igration flow is actually very straight forward as there are only a few options available for rebuild of the data. This chapter will outline and review the alternatives available for data reconstruction.
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发表于 2025-3-23 00:22:45 | 显示全部楼层
Full Chip Verification,this point in the book, the nine step flow is not a quick one. A great deal of automation can be incorporated to reduce the manpower associated with the tasks, but the sheer quantity of data that is required to be created is the gating factor. In the maximally automated flow, the machine time for si
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发表于 2025-3-23 03:53:27 | 显示全部楼层
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发表于 2025-3-23 05:54:03 | 显示全部楼层
978-1-4613-4982-2Springer Science+Business Media New York 2003
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