| 书目名称 | Kelvin Probe Force Microscopy |
| 副标题 | Measuring and Compen |
| 编辑 | Sascha Sadewasser,Thilo Glatzel |
| 视频video | http://file.papertrans.cn/543/542371/542371.mp4 |
| 概述 | First book dedicated soley to Kelvin force microscopy.Explains basics, realization, modulation and data interpretation.Provides important application examples.Useful reference to researchers and gradu |
| 丛书名称 | Springer Series in Surface Sciences |
| 图书封面 |  |
| 描述 | .Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.. |
| 出版日期 | Book 2012 |
| 关键词 | Kelvin probe microscopy; Nanotechnology; Scanning probe microscopy; Surface potential; Surface science |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-642-22566-6 |
| isbn_softcover | 978-3-642-27113-7 |
| isbn_ebook | 978-3-642-22566-6Series ISSN 0931-5195 Series E-ISSN 2198-4743 |
| issn_series | 0931-5195 |
| copyright | Springer-Verlag Berlin Heidelberg 2012 |
|Archiver|手机版|小黑屋|
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