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Arshad Khannd analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog c

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Arshad Khannd analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog c

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Arshad Khannd analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog c

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parameter-varying systems are described. Lastly recovery strategies appropriate to remaining actuator/sensor/communications resources are developed. .The authors exploit experience gained in research collaboration with academic and major industrial partners to validate advanced fault diagnosis and f

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Arshad Khanparameter-varying systems are described. Lastly recovery strategies appropriate to remaining actuator/sensor/communications resources are developed. .The authors exploit experience gained in research collaboration with academic and major industrial partners to validate advanced fault diagnosis and f

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Arshad Khanparameter-varying systems are described. Lastly recovery strategies appropriate to remaining actuator/sensor/communications resources are developed. .The authors exploit experience gained in research collaboration with academic and major industrial partners to validate advanced fault diagnosis and f

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Arshad Khanparameter-varying systems are described. Lastly recovery strategies appropriate to remaining actuator/sensor/communications resources are developed. .The authors exploit experience gained in research collaboration with academic and major industrial partners to validate advanced fault diagnosis and f

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Arshad Khanparameter-varying systems are described. Lastly recovery strategies appropriate to remaining actuator/sensor/communications resources are developed. .The authors exploit experience gained in research collaboration with academic and major industrial partners to validate advanced fault diagnosis and f

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Arshad Khan Technical objects and systems stated by these models are very large, and include various control systems, actuators, sensors, computer systems, communication systems, and mechanical, hydraulic, pneumatic, electrical and electronic devices. The analytical fault diagnosis techniques of these objects