Titlebook: Ion Beam Surface Layer Analysis; Volume 1 O. Meyer,G. Linker,F. Käppeler Book 1976 Springer Science+Business Media New York 1976 Cross sect

考博

Depth Profiling of Implanted 3He in Solids by Nuclear Reaction and Rutherford Backscatteringfiles obtained by both methods agree in their general shape, that obtained by the nuclear reaction method being broader and lower than the one obtained by RBS. Some possible reasons for the disagreement are discussed.

Mawkish

Analyzing the Formation of a thin Compound Film by Taking Moments on Backscattering Spectrabetween a reacted sample and an unreacted one. Alternative analytic methods are discussed, and an empirical cubic correction is found to give results in good agreement with those obtained by the moment method. The formation kinetics of a thin film of Pd.Si is taken as an example.

BOOST

uhe, Germany. The date fell between two related con­ ferences: "Application of Ion-Beams to Materials" at Warwick, Eng­ land and "Atomic Collisions in Solids" at Amsterdam, the Nether­ lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The ma

泥土谦卑

Energy Dependence of Proton Straggling in Carbonhe same trend with energy, but give slightly different values of straggling; this effect could be due to channeling, surface roughness or porosity. At the higher energy, straggling is linear with the square root of thickness, as expected from the Bohr theory. At the two lower energies there is a marked deviation from linearity.

Dedication

骗子

precede

消极词汇

DEFT

肥料

Near-Surface Investigation by Backscattering of N+Ions and Grazing Angle Beam Incidencee data were measured for He. and N. ions of energy 1,3 MeV on thin W layers. The geometrical effect is found to be by far more efficient than heavy ions. Actual resolution is demonstrated and discussed by means of the spectrum of a multilayer structure.