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Titlebook: Introduction to X-Ray Spectrometric Analysis; Eugene P. Bertin Book 1978 Springer Science+Business Media New York 1978 Instrumental Analys

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Energy-Dispersive X-Ray Spectrometry,nergy dispersion by high- and low-power x-ray tubes, radio-isotopes, and ion beams is discussed in Sections 4.1.4, 4.1.3, and 4.1.2, respectively. The advantages and limitations of energy and wavelength dispersion are compared in Section 3.5.4. This section (6.1) is concerned with only the analytica
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Qualitative and Semiquantitative Analysis,urate . of their concentrations. (The common expression . is redundant because a determination is necessarily quantitative.) In any of these three types of analysis, the interest may be in all constituent elements or only one or more specified elements.
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Quantitative Analysis,n preparation and presentation (Chapter 10). The analytical method is chosen mostly to correct absorption-enhancement effects and instrument errors. The specimen preparation-presentation technique is chosen mostly to deal with specimen errors.
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Specimen Preparation and Presentation,ewhat slower because the settings cannot be made as quickly. A modern, automatic, simultaneous spectrometer collects count data for up to 30 elements in 30–200 s; it has been remarked that simultaneous instruments collect data so fast that the readout time may become significant! An energy-dispersiv
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Electron-Probe Microanalysis, quantitative analysis for chemical elements (2)—based on measurement of the wavelengths and intensities of their characteristic x-ray spectral lines (3)—excited by an electron beam having diameter of the order 0.1–1 μm. The method permits in-place determination of composition and spacial variation
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Excitation; Wavelength Dispersion,Having considered the method and instrumentation of x-ray spectrometric analysis in general terms in Chapter 3, we now devote two chapters to a more detailed consideration of the instrument components and their functions.
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Detection and Readout; X-Ray Intensity Measurement,The fourth phase of an x-ray spectrometric analysis (Section 3.2) is detection of the characteristic x-rays emitted by the specimen.
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