Titlebook: Introduction to IDDQ Testing; Sreejit Chakravarty,Paul J. Thadikaran Book 1997 Springer Science+Business Media New York 1997 LSI.VLSI.circ

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Sreejit Chakravarty,Paul J. Thadikarandone so that emotion is not misused or exploited in legal procedures—and offer complementary legal and social/cognitive perspectives on these and other salient issues: Positive versus negative affect in legal decision making, emotion, eyewitness memory, and false memory, the influence of emotions on

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Book 1997tel, Texas Instruments, LSI Logic,Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. .This increase in the use of I.DDQ. testing should be of interestto three groups of individuals associated with the IC business:Product Managers and Test Engineers, CAD Tool Vendors and CircuitDesigners. .

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0929-1296 hould be of interestto three groups of individuals associated with the IC business:Product Managers and Test Engineers, CAD Tool Vendors and CircuitDesigners. .978-1-4613-7812-9978-1-4615-6137-8Series ISSN 0929-1296

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Sreejit Chakravarty,Paul J. Thadikaranry legal and social/cognitive perspectives on these and other salient issues: Positive versus negative affect in legal decision making, emotion, eyewitness memory, and false memory, the influence of emotions on978-1-4419-8124-0978-1-4419-0696-0Series ISSN 0146-7875 Series E-ISSN 2947-9479