Titlebook: Introduction to Analytical Electron Microscopy; John J. Hren,Joseph I. Goldstein,David C. Joy Book 1979 Springer Science+Business Media Ne

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Book 1979ts birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra? It‘s not likely that any of these developments alone would have been sufficient and there have been many others (microdiffra

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Microanalysis by Lattice Imaging,d is most powerful, viz. on a highly localised level. In this article the application of fringe imaging is considered for the determination of chemical composition, emphasising procedures for obtaining and interpreting the images in a reliable way and illustrating the situations where such images are beneficial.

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Microdiffraction, the introduction of the STEM electron microscope, the lens configuration used for diffraction was such that spherical aberration of the objective lens prevented diffraction patterns from an area less than 500 nm from being formed. This limitation, and the means for bypassing it with microdiffraction, is worth describing in detail.

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Convergent Beam Electron Diffraction,e so flat that some important angular average will not occur over such areas. Thickness and orientation are two crucial parameters of electron diffraction and it is essential to eliminate their variation within the illuminated volume if meaningful results are to be obtained.

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Radiation Effects in Analysis of Inorganic Specimens by TEM,tion of the atomic structure under analysis. Such perturbations may be generically labelled radiation effects and, where they lead to permanent alterations in atomic structure, can be sensibly termed radiation damage.

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