Titlebook: Intracranial Pressure and Brain Monitoring XIV; Martin U. Schuhmann,Marek Czosnyka Book 2012 Springer-Verlag/Wien 2012

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Magdalena Kasprowicz,Jennifer Diedler,Matthias Reinhard,Emmanuel Carrera,Peter Smielewski,Karol P. Bful of laboratories distributed around the world. More recently, electron micro­ scopists have become interested in EELS as a method of chemical analysis with the potential for achieving very high sensitivity and spatial resolution, and there is a growing awareness of the fact that the loss spectrum

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Rupert Faltermeier,Martin A. Proescholdt,Alexander Brawanskill as for high-precision measurements in microscopy. It continues to be advanced in its applications though the speed of the development is not high but steady together with technical improvements of both the coherent electron beam and the reconstruction system. Progress has been made since the publ

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Martin Shaw,I. Piper,P. Campbell,C. McKeown,J. Britton,K. Oommen,L. Stewart,I. Whittle,R. Gregson,E.nt book is the treatment of electron impact ion sources like ECR (Electron Qyclotron .Resonance) ion sources, EBIS (Electron .B_eam Ion S.ources), EBIT Electron .B_eam Ion Irap) and ERIS (Electron .Ring Ion S.ources), which altogether are able to produce ions of high charge states. This criterion de

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Hans E. Heissler,Kathrin König,Joachim K. Krauss,Eckhard Rickelsitation of various plasma components is obtained by a variety of diagnostic methods, involving photon spectroscopy, probe measurements as well as mass spectrometric plasma sampling. The latter usually requires the investigation of ions emerging through orifices in walls confining the plasma. So call

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