Titlebook: Information and Communication Technologies; 9th Conference of Ec Juan Pablo Salgado Guerrero,Janneth Chicaiza Espin Conference proceedings

Ablation

Yuliana Mercedes De La Cruz-Ramirez,Augusto Felix Olaza-Maguiña,Nadezhda Tarcila De La Cruz-Ramirezs in a coarse-to-fine manner. For face recognition, we train a light CNN to obtain a compact representation, where the rectified linear unit (ReLU) is replaced by max-feature-map (MFM). Our approach shows good performance on several datasets. And it is practicable due to its high speed, good accurac

粗俗人

死猫他烧焦

Jacinto Palma Zambrano,Tania Calle-Jimenez,Boris Orellana-Alvear (due to the large matrices involved) for standard optimization schemes. We test here a feasible alternative: an iterative scheme called . .. For this we describe an implementation for three light-sources in sufficient detail to permit code to be written. Then we give examples verifying experimental

genesis

RODE

Vertebra

rm layer, which can align quadrangle proposals into small feature maps. Furthermore, in order to extract effective features for recognition, we propose to encode the aligned RoI features by RNN into context information, combining spatial attention mechanism to generate text sequences. This overall p

SOW

寒冷

Alexandra La Cruz,Erika Severeyn,Roberto Matute,Juan Estradatraining images according to their resolutions. Then we create an antithetical training set and make sure that original training images have counterparts with antithetical resolutions in this new set. At last, a novel Contrastive Center Loss (CCL) is proposed to learn from images with different reso

DOLT

ratory in nature. It elaborates and extends existing theory. By doing so, it takes up a distinct position within scientific theory that is defined by three levels of analysis: (1) the meta-methodological level, (2) the methodological level, and (3) the theoretical level.978-3-8349-3553-3978-3-8349-3554-0

Amendment

Gustavo Chacón-Encalada,Lorena Jaramillo-Mediavilla,Wilson Rivera-Montesdeoca,Luis Suárez-Zambrano,I BTech and HND students in the fields of manufacturing engineering, computer aided design (CAD) and computer aided engineering (CAE) with transferable skills and knowledge. This book is also intended for technicians, technologists and engineers new to Creo Parametric software..978-3-319-79473-0978-3-319-23359-8