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Titlebook: Information Modeling for Interoperable Dimensional Metrology; Yaoyao (Fiona) Zhao,Robert Brown,Xun Xu Book 2011 Springer-Verlag London Lim

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Dimensional Metrology Interoperability Issues,ld be easily over billions. This chapter will provide an in depth discussion on interoperability issues across a dimensional metrology system. The standard data models developed in isolation for each element of dimensional metrology systems (introduced in previous chapters) will be analyzed and comp
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Outlook for the Future of Dimensional Metrology Systems Interoperability,t. Then, the standard and technology adoption lifecycle in the industry is briefly introduced to give the reader an overview of how industry receives new standards and technologies. Finally, the two emerging international standards for dimensional metrology systems are discussed and a summary is given.
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Low-Level Dimensional Metrology Process Planning and Execution, the choice of measurement device for a particular measurement plan represents the starting point of low-level dimensional measurement planning activity. Also, measurement plan execution is tightly linked with the low-level measurement planning. Often when the low-level measurement plan.
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Dimensional Metrology for Manufacturing Quality Control,ny tools to choose from. This chapter describes these approaches and tools in order to provide a backdrop for the types of information that are central to quality analysis and data reporting. Information modeling for different manufacturing industries is discussed for different types of quality control at the end of this chapter.
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Book 2011ent for today‘s digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity..Information Modeling for Interoperable Dimensional Metrology. analyzes interop
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Introduction,embly workpieces and the static characteristics of the workpiece have therefore been satisfied. In engineering, there are three types of metrology: dimensional, surface, and physical. This chapter first gives an inductive discussion of these three types of metrology and surface irregularities that can be measured by them.
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