Titlebook: Impact of Electron and Scanning Probe Microscopy on Materials Research; David G. Rickerby,Giovanni Valdrè,Ugo Valdrè Book 1999 Springer Sc

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Z-Contrast Scanning Transmission Electron Microscopy,ed to give the object. Interpretation must necessarily rely on simulation of images of trial objects. Even with the prospect of spherical aberration correction, coherent images will still take many forms depending on objective lens defocus and specimen thickness, and the inversion problem will remain.

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Environmental SEM and Related Applications,lection of these electrons is very similar to the image formed by the conventional Everhart-Thornley detector, even though the signal amplification process is different. Scattering of the primary beam electrons also results in the formation of amplified electrons, but contains no relevant image information.

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0168-132X from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different sc

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0168-132X ly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of mat978-0-7923-5940-1978-94-011-4451-3Series ISSN 0168-132X

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Metal-Ceramic Interfaces Studied with High Resolution Transmission Electron Microscopy,ces are frequently encountered. Despite their obvious technological importance, our basic understanding of interfaces, even relatively simple interfaces like grain-boundaries, is still rudimentary in relation to materials properties. The importance of interfaces is determined primarily by their inhe