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Titlebook: Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy; Proceedings from the Philip Moriarty,Sebastien Gauthier Conference p

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Imaging of Defects on Ge(001):H by Non-contact Atomic Force Microscopy,r a defect has a range where the short-range attractive force is detected, whereas over the hydrogen-terminated bonds, it is missing: atomic-scale imaging of hydrogens is possible only in the repulsive range. Thus, NC-AFM allows for clear determination of the different chemical activities of the defect compared to the surrounding passivated area.
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A Considered Approach to Force Extraction from Dynamic Force Microscopy Measurements,quantify the uncertainty arising from implementation of this technique. We also explore the validity of approximation formulae used to convert from frequency shift to force, finding that these approximations are only valid when the oscillation amplitude is at least an order of magnitude different than any characteristic interaction length scale.
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Theoretical Challenges of Simultaneous nc-AFM/STM Experiments,interpretation of experimental data and further proliferation of this technique strongly relies on our theoretical understanding of ongoing physical processes during scanning. Here, we discuss the current status of, and challenges for, the theoretical description of simultaneous AFM/STM measurements.
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2193-9691 Provides key insights into the current capabilities, and futImaging and Manipulation of Adsorbates using Dynamic Force Microscopy provides an overview of the latest developments in dynamic force microscopy (DFM) of atoms, molecules, and nanoparticles adsorbed on solid surfaces. Significant advances
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Origin of the KPFM Contrast in the Adsorption of a Triphenylene Derivative on KBr(001),ption conformation where five polar CN groups are adsorbed above five surface K. ions. The calculated value of the Kelvin potential difference between the molecular monolayer and KBr is in good agreement with the experimental value.
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2193-9691 ate atoms and molecules in the context of the fabrication of the type of logic gates described in Vol. 2. When used in conjunction with STM, DFM also enables a detailed comparison of the chemical ‘architecture’978-3-319-38110-7978-3-319-17401-3Series ISSN 2193-9691 Series E-ISSN 2193-9705
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Conference proceedings 2015 interconnection systems described in Vol. 1 of the series. DFM can also be used to translate atoms and molecules in the context of the fabrication of the type of logic gates described in Vol. 2. When used in conjunction with STM, DFM also enables a detailed comparison of the chemical ‘architecture’
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