找回密码
 To register

QQ登录

只需一步,快速开始

扫一扫,访问微社区

Titlebook: IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials; Proceedings of the I Meinhard Kuna,Andreas Rico

[复制链接]
楼主: 贫血
发表于 2025-3-26 22:11:23 | 显示全部楼层
发表于 2025-3-27 04:53:52 | 显示全部楼层
The Concept of Material Forces in Nonlinear Electro-elastostatics,l in crack problems. The formulations of material forces take into account the contribution of the outer space surrounding the body under consideration. It is shown that the contribution of the outer space is of importance when the polarization is relatively weak, for example in the case of electron
发表于 2025-3-27 07:39:16 | 显示全部楼层
发表于 2025-3-27 10:49:18 | 显示全部楼层
发表于 2025-3-27 16:28:06 | 显示全部楼层
Singularity Analysis of Electro-mechanical Fields in Angularly Inhomogeneous Piezoelectric Composit (AGPM) and under anti-plane deformation. The analysis is based on the mixed-variable state space formulation developed in this paper. The characteristic equation containing the singular order is derived using the method of variable separation. The results presented demonstrate the effects of the an
发表于 2025-3-27 20:17:47 | 显示全部楼层
发表于 2025-3-28 01:05:36 | 显示全部楼层
Periodic Set of the Interface Cracks with Limited Electric Permeability,terface cracks is considered. Uniformly distributed electromechanical loading is applied. The solution of the problem is obtained in close form by use of complex function theory. Formulae for stresses, electric displacement vector, elastic displacements and electric potential jump at the interface a
发表于 2025-3-28 04:04:31 | 显示全部楼层
Interfacial Delamination of PZT Thin Films,ed cantilever specimen is proposed to perform the delamination tests. The experimental results show that the multilayered Cr/PZT/PLT/Pt/Ti thin films deposited on single-crystal silicon substrates are delaminated along the interface between Cr and PZT layers in a brittle manner. Second, based on coh
发表于 2025-3-28 06:31:27 | 显示全部楼层
Mechanical Behavior of Thin Film Comprised of Sculptured Nano-elements,cretely arrayed nano-elements on a substrate is evaluated by means of an atomic force microscope (AFM) with a loading apparatus. The fact that the thin film eliminates stress singular field at the interface edge between dissimilar materials is numerically and experimentally elucidated.
发表于 2025-3-28 13:18:29 | 显示全部楼层
Meinhard Kuna,Andreas RicoeurIUTAM Symposia represents the state of the art in their topic and set the standard for the next 3-5 years.Includes supplementary material:
 关于派博传思  派博传思旗下网站  友情链接
派博传思介绍 公司地理位置 论文服务流程 影响因子官网 SITEMAP 大讲堂 北京大学 Oxford Uni. Harvard Uni.
发展历史沿革 期刊点评 投稿经验总结 SCIENCEGARD IMPACTFACTOR 派博系数 清华大学 Yale Uni. Stanford Uni.
|Archiver|手机版|小黑屋| 派博传思国际 ( 京公网安备110108008328) GMT+8, 2025-5-21 18:11
Copyright © 2001-2015 派博传思   京公网安备110108008328 版权所有 All rights reserved
快速回复 返回顶部 返回列表