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Titlebook: IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics; Proceedings of the I Alexis Lagarde Conference proceedings

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书目名称IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics
副标题Proceedings of the I
编辑Alexis Lagarde
视频video
丛书名称Solid Mechanics and Its Applications
图书封面Titlebook: IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics; Proceedings of the I Alexis Lagarde Conference proceedings
描述The request to organize under its patronage at Poitiers in 1998 a Symposium entitled “Advanced Optical Methods and Applications in Solid Mechanics” by the International Union of Theoretical and Applied Mechanics (I.U.T.A.M.) was well received for the following two reasons. First, for nearly 20 years no Symposium devoted to optical methods in solids had been organized. Second, recent advances in digital image processing provided many new applications which are described in the following. We have the honour to present here the proceedings of this Symposium. st th The Symposium took place from august 31 to September 4 at the Institut International de la Prospective in Futuroscope near Poitiers. A significant number of internationally renowned specialists had expressed their wish to participate in this meeting. The Scientific Committee proposed 16 general conferences and selected 33 regular lectures and 17 poster presentations. Papers corresponding to posters are not differentiated in the proceedings from those that were presented orally. It is worth noting that a total of 80 participants, representing 16 countries, registered for this symposium.. The Scientific Committee deserves prai
出版日期Conference proceedings 2002
关键词elasticity; fracture; mechanics; micromechanics
版次1
doihttps://doi.org/10.1007/0-306-46948-0
isbn_softcover978-90-481-5576-7
isbn_ebook978-0-306-46948-0Series ISSN 0925-0042 Series E-ISSN 2214-7764
issn_series 0925-0042
copyrightSpringer Science+Business Media Dordrecht 2002
The information of publication is updating

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Phase Measurement Method for Stress Analysis from Photoelastic Datae method for stress analysis from photoelastic fringe patterns is presented..The photoelastic phase maps are obtained with a circular polariscope. For the isoclinics calculation a four-step phase-shift algorithm is used. A white light source is used to avoid problems of low modulation in the fringe
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Generalized Phase-shifting Method for Measuring Photoelastic Fringe Parameters and its Applications so on, and for automatically measuring photoelastic parameters, relative fringe orders and principal-stress directions, in the whole field. The fringe orders obtained using the method were used to measure the stress intensity factor, and the principal-stress directions to extract the zero points. F
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Interference Blots in Integrated Fringe Patternser are areas where interference fringes have low contrast or even vanish totally. It has been shown that the cause of the interference blots is rotation of the principal stress axes. Since an arbitrary inhomogeneous birefringent medium is optically equivalent to a system of two birefringent plates,
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Visualisation of Photoelastic Fringes Within Three Dimensionnal Specimens Using an Optical Slicing Mo delimit a slice between two plane laser beams. The properties of polarization of the scattered light (Rayleigh law) and the interference possibilities of the diffused beams are used. By introducing speckle pattern properties we can analyse the correlation factor between two scattered beams as we c
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The Assessment of the T* Fracture Parameter During Creep Relaxationthe plastic zone develops in a regime of reducing stress and near-zero crack growth. This behaviour has been measured in the aluminium alloy 7075 T6, using moiré interferometry at 190°C, and the experimental data have been used to investigate the T. integral fracture parameter as a function of time
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Theory of Moiré Fringe Formation with an Electron Beameveral different magnifications. The fringes are characterized by their spatial frequency, orientation, and contrast. These features depend on the spatial frequency mismatch between the specimen grating and the raster scan lines, the diameter of the electron beam, and the detailed topography of the
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