| 书目名称 | IDDQ Testing of VLSI Circuits | | 编辑 | Ravi K. Gulati,Charles F. Hawkins | | 视频video | | | 图书封面 |  | | 描述 | Power supply current monitoring to detect CMOS IC defectsduring production testing quietly laid down its roots in themid-1970s. Both Sandia Labs and RCA in the United States and PhilipsLabs in the Netherlands practiced this procedure on their CMOS ICs. Atthat time, this practice stemmed simply from an intuitive sense thatCMOS ICs showing abnormal quiescent power supply current (I.DDQ.)contained defects. Later, this intuition was supported by data andanalysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton),Soden and Hawkins (Sandia Labs and the University of New Mexico),Jacomino and co-workers (Laboratoire d‘Automatique de Grenoble), andMaly and co-workers (Carnegie Mellon University).Interest in I.DDQ. testing has advanced beyond the data reportedin the 1980s and is now focused on applications and evaluationsinvolving larger volumes of ICs that improve quality beyond what canbe achieved by previous conventional means.In the conventional style of testing one attempts to propagate thelogic states of the suspended nodes to primary outputs. This is donefor all or most nodes of the circuit. For sequential circuits, inparticular, the complexity of finding suitable tests is v | | 出版日期 | Book 1993 | | 关键词 | CMOS; VLSI; complexity; computer-aided design (CAD); integrated circuit; logic; metal-oxide-semiconductor | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4615-3146-3 | | isbn_softcover | 978-1-4613-6377-4 | | isbn_ebook | 978-1-4615-3146-3 | | copyright | Springer Science+Business Media New York 1993 |
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发表于 2025-3-21 17:49:21
