Titlebook: High-Resolution Imaging and Spectrometry of Materials; Frank Ernst,Manfred Rühle Book 2003 Springer-Verlag Berlin Heidelberg 2003 AFM.STM.

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0933-033X e science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation 978-3-642-07525-4978-3-662-07766-5Series ISSN 0933-033X Series E-ISSN 2196-2812

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Electron Scattering,coherence is caused by the finite energy width and the lateral extent of the effective electron source, by parasitic incoherent perturbations, and by unavoidable inelastic scattering processes within the object. Inelastic scattering generally decreases the degree of coherence. Even for energy-filter

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Microstructural Characterization of Materials: An Assessment,es), was regarded as the main task. Concerning the special field of the imaging of surfaces, the invention of scanning tunneling microscopy (STM) in the eighties yielded a powerful method for atomic imaging of surfaces, complementary to high-resolution transmission electron microscopy (HRTEM), which

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Electron Scattering,y from that of classical solid particles. In particular, the interference between different partial waves affects the intensity distribution of an electron micrograph and prevents straightforward interpretation in many cases. Without such interference, the formation of an image would not be possible

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Structure Determination by Quantitative High-Resolution Transmission Electron Microscopy,ing the lattice fringes of a crystal lattice. There is no specific resolution threshold value separating “HR”-TEM from conventional TEM. Instead, the distinction is based on the fact that several diffracted beams are necessary to form the image of crystal planes. HRTEM is most important and powerful