Titlebook: High-Resolution Electron Microscopy for Materials Science; Daisuke Shindo,Kenji Hiraga Book 1998 Springer-Verlag Tokyo 1998 advanced mater

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Basis of High-Resolution Electron Microscopy,optical ray diagram with an optical objective lens, as shown in Fig. 1.1. When a crystal of lattice spacing . is irradiated with electrons of wavelength λ, diffracted waves will be produced at specific angles 2θ Satisfying the ., i.e., . The diffracted waves form diffraction spots on the .. In an el

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Practice of High-Resolution Electron Microscopy,ugh the back focal plane, so various high-resolution images containing different information may be obtained depending on their scattering amplitudes, which are affected by the diffraction conditions and the crystal thicknesses. Thus, before observing high-resolution images, we should clarify what s

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Book 1998of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential in