Titlebook: High Performance Memory Testing; Design Principles, F R. Dean Adams Book 2003 Springer Science+Business Media New York 2003 design.developm

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Static Random Access Memoriesver, many subtle analog effects that need be considered from both a design and a test perspective..The sensing scheme, decoder circuitry, redundancy, and layout arrangements all bear on the other memories, which will be covered in the remainder of this text. Therefore, it is recommended a finger be

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Multi-Port Memorieshe ports creates significant complexity. The multi-port complexity must be simulated from a design perspective and analyzed from a test perspective. Inadequate design analysis can easily result in an unwritable cell, one that disturbs if multiple ports read the same cell, or coupling between the wri

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Dynamic Random Access Memoriest to understand the differences that make DRAMs unique from other memories so that they are used in the correct applications. These unique aspects also require the proper fault modeling and test development. Since the analog effects are more severe in DRAMs, more test patterns and special voltage po