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Titlebook: Hardware Security Training, Hands-on!; Mark Tehranipoor,N. Nalla Anandakumar,Farimah Fara Textbook 2023 The Editor(s) (if applicable) and

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Security Verification,ed to implement the design as well as the interaction among the IPs. These vulnerabilities not only increase the security verification effort but also can increase design complexity and time to market. If the design and verification engineers are equipped with a comprehensive set of security propert
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Power Analysis Attacks on AES, leaked, e.g., through power consumption or electromagnetic radiation. Correlation power analysis (CPA) is the most popular and powerful type of power analysis attacks against cryptographic modules. An attacker exploits the correlation between the power consumed by the device and the data generated
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EM Side-Channel Attack on AES,t key on the cryptographic circuit by measuring power consumption or electromagnetic radiation during cryptographic operations, are attracting attentions. The EM-based side-channel attack is more threatening because it is a non-contact attack compared with power analysis attacks. In this chapter, we
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Logic-Locking Insertion and Assessment,hardware security threats at the IC manufacturing supply chain. Logic locking primarily helps the designer to protect the IPs against IP theft/piracy, tampering, counterfeiting, reverse engineering, overproduction, and unauthorized activation. In this chapter, we demonstrate different logic-locking
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Clock Glitch Fault Attack on FSM in AES Controller,ange its behavior or to induce faults into its computations. There are many common means used to inject such faults: laser shots, electromagnetic pulses, clock glitch, chip underpowering, temperature increase, etc. In this chapter, we demonstrate how to perform a clock glitch in an AES block impleme
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Voltage Glitch Attack on an FPGA AES Implementation,ffort. A device’s operation is intercepted during a fault injection attack, a type of active side-channel attack that allows attackers to access sensitive data. The attacker alters the clock, temperature, and power supply connections, uses a high-powered laser, performs EM injection, or injects a fa
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Universal Fault Sensor,ated circuits or electronic systems. Fault injection attacks (FIAs) can be carried out using clock glitch, voltage glitch, laser, optical instruments, electromagnetic (EM) emanation, and more. One promising solution to detect FIAs is to use on-chip sensors to capture the attack effect. However, havi
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