Titlebook: Handbook of Advanced Nondestructive Evaluation; Nathan Ida,Norbert Meyendorf Living reference work 20200th edition Emerging nondestructiv

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思想上升

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3D X-ray Tomography - Basics and Latest Developments,eld are mentioned. Additionally, particular issues of micro- and nano-scale X-ray Computed Tomography are described. Finally, we attempt to look forward into the upcoming future of industrial X-ray imaging systems which most probably will evolve to cognitive sensor networks by applying advanced machine-learning technologies.

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https://doi.org/10.1007/978-3-8349-7136-4ology are between 2 nm and 1 μm on flat and smooth substrates. In the context of use of X-ray reflectivity as an NDE technique in a manufacturing environment, there is discussion of approaches to very rapid data collection.