| 书目名称 | Failure Analysis of Integrated Circuits | | 副标题 | Tools and Techniques | | 编辑 | Lawrence C. Wagner | | 视频video | | | 丛书名称 | The Springer International Series in Engineering and Computer Science | | 图书封面 |  | | 描述 | .Failure Analysis of Integrated Circuits: Tools andTechniques. provides a basic understanding of how the most commonlyused tools and techniques in silicon-based semiconductors are appliedto understanding the root cause of electrical failures in integratedcircuits. These include applications specific to performing failureanalysis such as decapsulation, deprocessing, and fail site isolation,as well as physical and chemical analysis tools and techniques. Thecoverage is qualitative, and it provides a general understanding formaking intelligent tool choices. Also included is coverage of theshortcomings, limitations, and strengths of each technique. ..Failure Analysis of Integrated Circuits: Tools and Techniques. isa `must have‘ reference work for semiconductor professionals andresearchers. | | 出版日期 | Book 1999 | | 关键词 | circuit; diagnosis; energy; integrated circuit; semiconductor | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4615-4919-2 | | isbn_softcover | 978-1-4613-7231-8 | | isbn_ebook | 978-1-4615-4919-2Series ISSN 0893-3405 | | issn_series | 0893-3405 | | copyright | Springer Science+Business Media New York 1999 |
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发表于 2025-3-21 18:25:23
