| 书目名称 | Electrothermal Analysis of VLSI Systems | | 编辑 | Yi-Kan Cheng,Ching-Han Tsai,Sung-Mo Steve Kang | | 视频video | | | 图书封面 |  | | 描述 | .Electrothermal Analysis of VLSI Systems. addresseselectrothermal problems in modern VLSI systems. .Part I, The Building Blocks, discusses electrothermal phenomena andthe fundamental building blocks that electrothermal simulationrequires (including power analysis, temperature-dependent devicemodeling, thermal/electrothermal simulation, and experimentalsetup-calibration). .Part II, The Applications, discusses three important applications ofVLSI electrothermal analysis including temperature-dependentelectromigration diagnosis, cell-level thermal placement andtemperature-driven power and timing analysis. ..Electrothermal Analysis of VLSI Systems. will be useful forresearchers in the fields of IC reliability analysis and physicaldesign, as well as VLSI designers and graduate students. | | 出版日期 | Book 2002 | | 关键词 | CMOS; VLSI; calculus; diagnosis; integrated circuit; modeling; simulation; tables | | 版次 | 1 | | doi | https://doi.org/10.1007/b117332 | | isbn_softcover | 978-1-4757-7373-6 | | isbn_ebook | 978-0-306-47024-0 | | copyright | Springer Science+Business Media New York 2002 |
The information of publication is updating
|
|
发表于 2025-3-21 18:48:34
