Titlebook: Electron Beam Analysis of Materials; M. H. Loretto Book 1984 Springer Science+Business Media B.V. 1984 X-ray.crystal.diffraction.electron

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Stephen J. Lockwood,Alexa B. Kimballaracteristic peaks of the elements. The quantitative interpretation of X-ray data from thin samples differs from the interpretation of similar data from thick samples in several ways. The whole of the following discussion of the interpretation of X-ray data will be based on the assumption that the d

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Introduction to Electron Beam Instruments,id instruments. Partly because the individual instruments have been developed separately, and partly because some instruments generate data which are more immediately interpretable, the fundamental relationships between the techniques and instruments tend to be obscured. The aims of this book are fi

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Electron-Specimen Interactions,pret this information it is clearly essential that the origin of these signals, and the influence of all important experimental variables on them be understood. The generation of the signals which will be covered in some detail in this book, will be dealt with in turn in this chapter, together with

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Layout and Operational Modes of Electron Beam Instruments, The transmitted electrons are generally used to form either an image or a diffraction pattern of the specimen and schematic ray diagrams for these two modes of operation are shown in Fig. 3.1(a) and (b). The transmitted electrons can also be used for microanalysis since the characteristic energy lo

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Interpretation of Diffraction Information,n and collection of diffraction data have been discussed in earlier chapters, but the present interest lies in the information which can be obtained concerning the specimen; the aim of electron beam techniques being to obtain detailed structural and chemical information from defined regions of the s

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