Titlebook: Electrical Properties of Indium Arsenide Nanowires and Their Field-Effect Transistors; Mengqi Fu Book 2018 Springer Nature Singapore Pte L

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,Fabrication, Characterization and Parameter Extraction of InAs Nanowire-Based Device,ive as introduction on the growth method, fabrication techniques, characterization methods of materials and devices, measurement systems, and way to extract the electrical parameters of InAs nanowires FET devices.

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Ein- und Zwei-Stichprobentests,an 10 nm could be needed in field-effect transistors (FETs) as the channel length scales down to tens of nanometers to improve the performance and increase the integration. In this chapter, we report FETs based on ultrathin wurtzite-structured InAs NWs, with the smallest NW diameter being 7.2 nm. Th

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Die innere Struktur des sozialen Verbandes, growth systems, MBE and MOCVD. Bases on the statistical data of more than 70 InAs nanowires back-gated FETs whose diameter range from 16 nm to more than 100 nm, we find that when the diameter of InAs nanowires is relatively small, most of the MOCVD-grown InAs nanowires have similar electron mobilit

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