| 书目名称 | Elastic and Inelastic Scattering in Electron Diffraction and Imaging | | 编辑 | Zhong Lin Wang | | 视频video | | | 图书封面 |  | | 描述 | Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P‘(r), for example, is denoted by the same symbol P‘(u) in recipr | | 出版日期 | Book 1995 | | 关键词 | crystal; diffraction; elastic scattering; electron diffraction; electron microscopy; electrons; microscopy | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4899-1579-5 | | isbn_softcover | 978-1-4899-1581-8 | | isbn_ebook | 978-1-4899-1579-5 | | copyright | Springer Science+Business Media New York 1995 |
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发表于 2025-3-21 17:45:41
