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Titlebook: Design for Manufacturability and Statistical Design; A Constructive Appro Michael Orshansky,Sani R. Nassif,Duane Boning Book 2008 Springer-

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书目名称Design for Manufacturability and Statistical Design
副标题A Constructive Appro
编辑Michael Orshansky,Sani R. Nassif,Duane Boning
视频video
概述Unified Treatment of Data Collection, Modeling, and Statistical CAD.Covers From Fabrication to Design to CAD.Deals With the Extraction of Fab Information into distrubutions for analysis.Circuit Struct
丛书名称Integrated Circuits and Systems
图书封面Titlebook: Design for Manufacturability and Statistical Design; A Constructive Appro Michael Orshansky,Sani R. Nassif,Duane Boning Book 2008 Springer-
描述.Design for Manufacturability and Statistical Design: A Constructive Approach. provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to ....understanding the causes of variability; ....design of test structures for variability characterization; ....statistically rigorous data analysis;....techniques of design for manufacturability in lithography and in chemical mechanical polishing;....statistical simulation, analysis, and optimization techniques for improving parametric yield....Design for Manufacturability and Statistical Design: A Constructive Approach. presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies.  It is an important reference
出版日期Book 2008
关键词Computer-Aided Design (CAD); Simulation; circuit design; data analysis; integrated circuit; modeling; opti
版次1
doihttps://doi.org/10.1007/978-0-387-69011-7
isbn_softcover978-1-4419-4044-5
isbn_ebook978-0-387-69011-7Series ISSN 1558-9412 Series E-ISSN 1558-9420
issn_series 1558-9412
copyrightSpringer-Verlag US 2008
The information of publication is updating

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Front End Variabilityance of integrated circuits [6]. Several taxonomies can be used to describe the different variability mechanisms, according to their causes, spatial scales, the particular IC layer they impact, and whether their ability can be described using non-stochastic models. Here we briefly discuss these taxonomies.
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Statistical Foundations Of Data Analysis And Modelinges required are often different from those that are familiar to most circuit designers. In this chapter, we discuss some specific statistical concepts useful for statistical design. Along the way we will attempt to develop a more refined view of what variability is, and how to describe it in useful, formal, and unambiguous terms.
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https://doi.org/10.1007/978-0-387-69011-7Computer-Aided Design (CAD); Simulation; circuit design; data analysis; integrated circuit; modeling; opti
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Interviewer- bzw. Befragtenhinweise,uch as integrated inductors or capacitors formed within the interconnect process layers. Because the back end process shares many technologies and tools with the front end, many of the variations affecting the front end are also operative here, particularly those related to lithography and etch. In
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