Titlebook: Computer Vision for Electronics Manufacturing; L. F. Pau Book 1990 Plenum Press, New York 1990 Sensor.Signal.Wafer.algorithms.circuit.comp

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https://doi.org/10.1007/0-306-47376-3rea of testing. The tremendous importance of this new approach in electronics stems from the fact that, so far, visual inspection and electrical testing have been kept separate, hence the term “integrated testing” (Figure 46). Two cases will be discussed—precap silicon IC and GaAs IC testing.

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The Demographic Correlates of Health Status,om artificial intelligence to manipulate and evaluate symbolic information, which is typically of a more qualitative nature (Figure 77). It is not the purpose of this book to present knowledge-based processing in detail; to this end, see Refs. 71–75.

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Elizabeth Thomson,Jennifer A. Hollandis quantization, each digital value will correspond to a range of values .. The number of quantization levels .., ..,…, .., where the .. are the values .(.) may assume, may itself be relatively small or large.

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