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Titlebook: Chemistry and Physics of Solid Surfaces VI; Ralf Vanselow,Russell Howe Textbook 1986 Springer-Verlag Berlin Heidelberg 1986 catalysis.chem

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The Time-of-Flight Atom-Probe and Its Application to Surface Analysis and Gas-Surface Interactions,. It is a combination of a field-ion microscope and a time-of-flight mass spectrometer. The tip is mounted on either an external or an internal gimbal system, and a small probe hole covering a few atom image diameters is open at the screen assembly. Behind the probe hole is a ToF tube and an ion det
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High-Resolution Electron Microscopy in Surface Science,cal methods, primarily using electrons, are able to provide direct real-space information about local inhomogeneities such as surface steps, terraces, domains, and defects. As a consequence of technical improvements, high-resolution electron microscopes in particular are nowadays capable of atomic i
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Surface Electronic States,rt and assume that the atomic structure and atomic motion (e.g., surface vibrations) have been determined already by using techniques as described in several other parts of this series. To characterize an electron in a crystalline solid, it is sufficient to know its quantum numbers, i.e., energy, mo
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Inverse Photoemission Spectroscopy,chniques for experiments of this kind are still developing, so in this chapter, after a historical survey in Sect.18.1, we try to give a “snapshot” of their present state. In Sect.18.2, we present the current state of the experimental instrumentation. Section 18.3 gives a short review of the work on
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Chemistry and Physics of Solid Surfaces VI978-3-642-82727-3Series ISSN 0931-5195 Series E-ISSN 2198-4743
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https://doi.org/10.1007/978-1-4842-4270-4mostly been obtained from the energy and angular distribution of emitted or scattered electrons, while the “spin” property has been exploited to a much lesser extent. This chapter is intended to show what kind of new information can be gained if the electron spin is explicitly taken into account, in addition to the electron momentum.
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