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Titlebook: Characterization of Solid Polymers; New techniques and d S. J. Spells Book 1994 Chapman & Hall 1994 Polymer.Siliconharzmasse.crystal.infrar

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Book 1994ientist is faced with an expanding array of experimental tools for addressing both fundamental science and industrial problems. This work reviews some recent developments in structural techniques, with the aim of presenting the current ‘state of the art‘ in a selection of areas.
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Electron crystallography of linear polymers, for electrons which enables these thin lamellar plates to be examined as single crystals [3]. What is not generally appreciated is that the electron microscope can also be employed as an instrument for the quantitative determination of linear polymer crystal structures [4].
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New techniques in microscopy, the same year, Binnig, Quate and Gerber published a description of the atomic force microscope, AFM[3]. This was the first, and remains the most important, offspring in a family of scanning probe microscopes derived from the STM concept and technology.
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