SCIE期刊Journal of X-Ray Science and Technology 2024/2025影响因子:1.741 (J X-RAY SCI TECHNOL) (0895-3996). (PHYSICS, APPLIED)

显示全部楼层 · 发表于 2025-3-21 17:34:18

SCIE(SCI)期刊Journal of X-Ray Science and Technology(20 21 REV HIST)影响因子

SCIE(SCI)期刊Journal of X-Ray Science and Technology(J X-RAY SCI TECHNOL)影响因子@(应用物理学)学科排名

SCIE(SCI)期刊Journal of X-Ray Science and Technology(20 21 REV HIST)总引论文

SCIE(SCI)期刊Journal of X-Ray Science and Technology(J X-RAY SCI TECHNOL)总引论文@(应用物理学)学科排名

SCIE(SCI)期刊Journal of X-Ray Science and Technology(20 21 REV HIST)影响因子

SCIE(SCI)期刊Journal of X-Ray Science and Technology(J X-RAY SCI TECHNOL)总引频次@(应用物理学)学科排名

SCIE(SCI)期刊Journal of X-Ray Science and Technology(20 21 REV HIST)即时影响因子

SCIE(SCI)期刊Journal of X-Ray Science and Technology(J X-RAY SCI TECHNOL)即时影响因子@(应用物理学)学科排名

SCIE(SCI)期刊Journal of X-Ray Science and Technology(20 21 REV HIST)五年累积影响因子

SCIE(SCI)期刊Journal of X-Ray Science and Technology(J X-RAY SCI TECHNOL)五年累积影响因子@(应用物理学)学科排名

显示全部楼层 · 发表于 2025-3-21 23:51:19

Submitted on: 08 August 2021. Revised on: 20 September 2021. Accepted on: 11 October 2021. Journal of X-Ray Science and Technology

显示全部楼层 · 发表于 2025-3-22 02:33:01

显示全部楼层 · 发表于 2025-3-22 04:49:10

Submitted on: 04 July 2006. Revised on: 12 August 2006. Accepted on: 26 August 2006. Journal of X-Ray Science and Technology

显示全部楼层 · 发表于 2025-3-22 11:02:43

Submitted on: 13 January 2011. Revised on: 07 February 2011. Accepted on: 28 February 2011. Journal of X-Ray Science and Technology

显示全部楼层 · 发表于 2025-3-22 14:39:18

显示全部楼层 · 发表于 2025-3-22 19:38:26

Submitted on: 06 February 2019. Revised on: 04 March 2019. Accepted on: 27 March 2019. Journal of X-Ray Science and Technology

显示全部楼层 · 发表于 2025-3-22 23:39:51

Submitted on: 15 May 2004. Revised on: 24 May 2004. Accepted on: 20 June 2004. Journal of X-Ray Science and Technology

显示全部楼层 · 发表于 2025-3-23 02:33:27

Submitted on: 19 July 2022. Revised on: 13 August 2022. Accepted on: 21 August 2022. Journal of X-Ray Science and Technology

显示全部楼层 · 发表于 2025-3-23 08:48:55

Submitted on: 26 November 2006. Revised on: 06 January 2007. Accepted on: 01 February 2007. Journal of X-Ray Science and Technology

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