| 期刊全称 | Built-in-Self-Test and Digital Self-Calibration for RF SoCs | | 影响因子2023 | Sleiman Bou-Sleiman,Mohammed Ismail | | 视频video | | | 发行地址 | Applies Built-in-Self-Test (Bi. ST) and Built-in-Self-Calibration (Bi..SC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibrati | | 学科分类 | SpringerBriefs in Electrical and Computer Engineering | | 图书封面 |  | | 影响因子 | This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. | | Pindex | Book 2012 |
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发表于 2025-3-21 16:31:11
