| 期刊全称 | Boundary-Scan Interconnect Diagnosis | | 影响因子2023 | José T. Sousa,Peter Y. K. Cheung | | 视频video | | | 学科分类 | Frontiers in Electronic Testing | | 图书封面 |  | | 影响因子 | .Boundary-Scan Interconnect Diagnosis. explains how tosynthesize digital diagnostic sequences for wire interconnects usingboundary-scan, and how to assess the quality of those sequences. Itsimportance has to do with designing complex electronic systems usingpre-designed intellectual property (IP) cores, which is becomingincreasingly popular nowadays. Since tests for pre-designed cores canbe supplied with the cores themselves, the only additional tests thatneed to be developed to test and diagnose the entire system are thosefor wire interconnects between the cores. .Besides the trivial solutions that are often used to solve thisproblem, there are many more methods that enable significantoptimizations of test vector length and/or diagnostic resolution. Thebook surveys all existing methods of this kind and proposes new ones.In the new approach circuit and interconnect faults are carefullymodeled, and graph techniques are applied to solve the problem. Theoriginal feature of the new method is the fact that it can be adjustedto provide shorter test sequences and/or greater diagnosticresolution. The effectiveness of existing and proposed methods is thenevaluated using real electronic asse | | Pindex | Book 2001 |
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发表于 2025-3-21 16:15:43
