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Titlebook: BiCMOS Technology and Applications; A. R. Alvarez Book 1993Latest edition Springer Science+Business Media New York 1993 CMOS.Standard.anal

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发表于 2025-3-21 17:15:13 | 显示全部楼层 |阅读模式
期刊全称BiCMOS Technology and Applications
影响因子2023A. R. Alvarez
视频video
学科分类The Springer International Series in Engineering and Computer Science
图书封面Titlebook: BiCMOS Technology and Applications;  A. R. Alvarez Book 1993Latest edition Springer Science+Business Media New York 1993 CMOS.Standard.anal
影响因子.BiCMOS Technology and Applications, Second Edition.provides a synthesis of available knowledge about the combination ofbipolar and MOS transistors in a common integrated circuit - BiCMOS.In this new edition all chapters have been updated and completely newchapters on emerging topics have been added. In addition, .BiCMOSTechnology and. .Applications, Second Edition. provides thereader with a knowledge of either CMOS or Bipolar technology/design areference with which they can make educated decisions regarding theviability of BiCMOS in their own application...BiCMOS Technology and Applications, Second Edition. is vitalreading for practicing integrated circuit engineers as well astechnical managers trying to evaluate business issues related toBiCMOS. As a textbook, this book is also appropriate at the graduatelevel for a special topics course in BiCMOS. A general knowledge indevice physics, processing and circuit design is assumed. Given thedivision of the book, it lends itself well to a two-part course; oneon technology and one on design. This will provide advanced studentswith a good understanding of tradeoffs between bipolar and MOS devicesand circuits..
Pindex Book 1993Latest edition
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发表于 2025-3-21 23:56:03 | 显示全部楼层
Intelligent Systems and Pattern Recognitionthe device designer wishes to optimize the performance of the transistors while simultaneously maintaining process simplicity. The challenge to achieve this in the BiCMOS environment is heightened because the process requirements for the MOSFET and bipolar transistors often conflict with one another
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Endra Joelianto,Herman Y. Sutarton and area have been regarded as the theoretical indications for technology performance and density. In a similar manner memory access time, memory power dissipation and memory size have been regarded as the practical indications of technology performance and density. Against this empirical yard sti
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Georg Ruhrmann,Jörg-Uwe Nielandtudies have shown that today test can easily account for onethird of development effort but test-escapes still account for 30% of all defective devices removed from printed circuit boards, Fig. 7.1 [.]. With test playing such an important role, it is imperative that the implications of a technology
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https://doi.org/10.1007/978-3-322-81044-1grated circuits evolved from the bipolar technologies with vertical . transistors and lateral . transistors. While bipolar analog integrated circuits continued to develop, NMOS technologies were becoming popular in digital integrated circuits for their high packing density. For analog applications,
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https://doi.org/10.1007/978-3-319-91941-6 design technology have resulted in increasingly complex designs. Most important of all, the data management of these complex new designs has become difficult. VLSI design is now gated by the available set of software tools. The tools that encompass the entire gamut of design tasks are . software.
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