| 期刊全称 | Journal of Micro-Nanopatterning Materials and Metrology-JM3 | | 期刊简称 | J MICRO-NANOPATTERN | | 影响因子2024 | 1.556 | | 视频video | | | ISSN | 1932-5150 | | eISSN | 2708-8340 | | 出版商 | SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | | 发行地址 | 1000 20TH ST, PO BOX 10, BELLINGHAM, USA, WA, 98225 | | 学科分类 | 1.Science Citation Index Expanded (SCIE)--Engineering, Electrical & Electronic | Nanoscience & Nanotechnology | Materials Science, Multidisciplinary | Optics; 2.Current Contents Electronics & Telecommunications Collection--Electronics & Electrical Engineering; 3.Current Contents Engineering, Computing & Technology--Electrical & Electronics Engineering; 4.Current Contents Physical, Chemical & Earth Sciences--Applied Physics/Condensed Matter/Materials Science; 5.Essential Science Indicators--Engin | | 出版语言 | English |
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发表于 2025-3-21 16:38:32
