Titlebook: Automatic Generation of Combinatorial Test Data; Jian Zhang,Zhiqiang Zhang,Feifei Ma Book 2014 The Author(s) 2014 Combinatorial testing.Co

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Automatic Generation of Combinatorial Test Data978-3-662-43429-1Series ISSN 2191-5768 Series E-ISSN 2191-5776

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Partition Algorithms on Intervals cases are generated one by one, until the coverage requirement is met, while each newly-generated test case covers as many uncovered target combinations as possible. Compared to other approaches, the one-test-at-a-time algorithms are more flexible to deal with various kinds of special test requirem

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https://doi.org/10.1007/978-3-662-43429-1Combinatorial testing; Covering array; Orthogonal array; Test case generation