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SCIE期刊JOURNAL OF ELECTRONIC IMAGING 2024/2025影响因子:1.177 (J ELECTRON IMAGING) (1017-9909). (OPTICS)(光学)Science Citation

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发表于 2025-3-21 17:29:25 | 显示全部楼层 |阅读模式
期刊全称JOURNAL OF ELECTRONIC IMAGING
期刊简称J ELECTRON IMAGING
影响因子20241.177
视频video
ISSN1017-9909
eISSN1560-229X
出版商SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
发行地址1000 20TH ST, PO BOX 10, BELLINGHAM, USA, WA, 98225
学科分类1.Science Citation Index Expanded (SCIE)--Engineering, Electrical & Electronic | Optics | Imaging Science & Photographic Technology; 2.Current Contents Electronics & Telecommunications Collection--Optics & Laser Research & Technology; 3.Current Contents Engineering, Computing & Technology--Optics & Acoustics; 4.Essential Science Indicators--Engineering;
出版语言English
The information of publication is updating

SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)影响因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(J ELECTRON IMAGING)影响因子@(光学)学科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)总引论文


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(J ELECTRON IMAGING)总引论文@(光学)学科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)影响因子


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SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)即时影响因子


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SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)五年累积影响因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(J ELECTRON IMAGING)五年累积影响因子@(光学)学科排名


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发表于 2025-3-21 22:07:15 | 显示全部楼层
Submitted on: 02 May 2011. Revised on: 18 June 2011. Accepted on: 28 July 2011. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
发表于 2025-3-22 03:56:42 | 显示全部楼层
Submitted on: 01 October 2016. Revised on: 02 November 2016. Accepted on: 26 November 2016. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
发表于 2025-3-22 05:35:03 | 显示全部楼层
Submitted on: 29 April 2022. Revised on: 13 August 2022. Accepted on: 20 September 2022. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
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发表于 2025-3-22 14:57:21 | 显示全部楼层
Submitted on: 05 December 2005. Revised on: 26 December 2005. Accepted on: 31 January 2006. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
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发表于 2025-3-23 09:37:40 | 显示全部楼层
Submitted on: 14 May 2010. Revised on: 02 July 2010. Accepted on: 22 August 2010. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
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