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Titlebook: Applied RHEED; Reflection High-Ener Wolfgang Braun Book 1999 Springer-Verlag Berlin Heidelberg 1999 electron energy loss spectroscopy.epita

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期刊全称Applied RHEED
期刊简称Reflection High-Ener
影响因子2023Wolfgang Braun
视频video
发行地址Up-to-date review of the state of the art.Important methods for surface and semiconductor physics.Includes supplementary material:
学科分类Springer Tracts in Modern Physics
图书封面Titlebook: Applied RHEED; Reflection High-Ener Wolfgang Braun Book 1999 Springer-Verlag Berlin Heidelberg 1999 electron energy loss spectroscopy.epita
影响因子The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
Pindex Book 1999
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书目名称Applied RHEED影响因子(影响力)




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书目名称Applied RHEED网络公开度




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书目名称Applied RHEED被引频次




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书目名称Applied RHEED年度引用




书目名称Applied RHEED年度引用学科排名




书目名称Applied RHEED读者反馈




书目名称Applied RHEED读者反馈学科排名




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Book 1999aces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
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https://doi.org/10.1007/BFb0109548electron energy loss spectroscopy; epitaxy; semiconductor; simulation; spectroscopy
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978-3-662-15614-8Springer-Verlag Berlin Heidelberg 1999
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Applied RHEED978-3-540-49485-0Series ISSN 0081-3869 Series E-ISSN 1615-0430
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Reflection high-energy electron diffraction (RHEED),
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