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Titlebook: Application of Particle and Laser Beams in Materials Technology; P. Misaelides Book 1995 Springer Science+Business Media Dordrecht 1995 Va

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发表于 2025-3-21 16:05:50 | 显示全部楼层 |阅读模式
期刊全称Application of Particle and Laser Beams in Materials Technology
影响因子2023P. Misaelides
视频video
学科分类NATO Science Series E:
图书封面Titlebook: Application of Particle and Laser Beams in Materials Technology;  P. Misaelides Book 1995 Springer Science+Business Media Dordrecht 1995 Va
影响因子The development of advanced materials with preselected properties is one of the main goals of materials research. Of especial interest are electronics, high-temperature and supemard materials for various applications, as well as alloys with improved wear, corrosion and mechanical resistance properties. The technical challenge connected with the production of these materials is not only associated with the development of new specialised preparation techniques but also with quality control. The energetic charged particle, electron and photon beams offer the possibility of modifying the properties of the near-surface regions of materials without seriously affecting their bulk, and provide unique analytical tools for testing their qUality. This volume includes most of the lectures and contributions delivered at the NATO-funded Advanced Study Institute "Application of Particle and Laser Beams in Materials Technology", which was held in Kallithea, Chalkidiki, in Northern Greece, from the 8th to the 21st of May, 1994 and attended by 73 participants from 21 countries. The aim of this ASI was to provide to the participants an overview of this rapidly expanding field. Fundamental aspects con
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发表于 2025-3-21 22:46:42 | 显示全部楼层
Book 1995 in Materials Technology", which was held in Kallithea, Chalkidiki, in Northern Greece, from the 8th to the 21st of May, 1994 and attended by 73 participants from 21 countries. The aim of this ASI was to provide to the participants an overview of this rapidly expanding field. Fundamental aspects con
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Febrile Neutropenia: Management Issuesuctors by observing the surface-sensitive laser-induced photoluminescence from thin layers of InGaAs and GaAs ., during exposure of their surfaces to reactive gaseous species. We have observed the surface passivation to improve by as much as a factor of 6000 following an exposure of a few seconds to
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Depth Profiling in Combination with Sputteringthe sample as well as on the bombardment parameters. Quite generally, the best depth resolution is achieved using low-energy primary ion beams and glancing angles of bombardment, but this is accomplished only at the expense of erosion rate and lateral resolution (due to reduced beam current and enla
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Optical Spectrometry Coupled with Laser Ablation for Analytical Applications on Solidss are discussed, each making use of a particular phase of the laser ablation process: in LA-OES, that is Optical Emission Spectroscopy, the direct emission of the produced plasma is analysed; in LA-LIF, transitions of the cooled atomic vapour are resonantly excited by a dye-laser; in LA-ICP-OES, the
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Laser Beam Probes for Semiconductor Processinguctors by observing the surface-sensitive laser-induced photoluminescence from thin layers of InGaAs and GaAs ., during exposure of their surfaces to reactive gaseous species. We have observed the surface passivation to improve by as much as a factor of 6000 following an exposure of a few seconds to
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0168-132X y 73 participants from 21 countries. The aim of this ASI was to provide to the participants an overview of this rapidly expanding field. Fundamental aspects con978-90-481-4510-2978-94-015-8459-3Series ISSN 0168-132X
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